PATENTS:
7,151,307 – Integrated semiconductor circuits on photo-active germanium substrates.
7,119,271 – Wide-bandgap, lattice-mismatched window layer for a solar conversion device.
6,787,818 – Diffused junction photodetector and fabrication technique.
6,380,601 – Multilayer semiconductor structure with phosphide-passivated germanium substrate.
6,340,788 – Multijunction photovoltaic cells and panels using a silicon or silicon-germanium active substrate cell for space and terrestrial applications.
6,255,580 – Bilayer passivation structure for photovoltaic cells.
6,150,603 – Bilayer passivation structure for photovoltaic cells.
EXPERIENCE:
Spectrolab, Inc. – Boeing Company subsidiary Sylmar, CA
Spectrolab is the world's leading manufacturer of high efficiency compound semiconductor solar cells and panel arrays.
Senior Staff Engineer 2012 - present
• Support research and development projects focusing on next-generation space and terrestrial products
• Project management
Research Development Engineer/Supervisor 2005-Sep 2008
• Development, optimization, and characterization of sub-cells ranging in band-gap from 0.9eV to 2.0eV for terrestrial and space applications.
• Research and development of inverted, metamorphic (IMM) high efficiency multi-junction solar cells for terrestrial and space applications.
Engineering Supervisor – Measurement 2003-2005
• Supervision of solar cell wafer measurement / diagnostics for MOVPE screening.
• Implemented 5S Lean Manufacturing principles for measurements lab.
• Implemented SPC for key solar cell performance parameters and measurement standards.
Engineering Supervisor – Optoelectronic Products 2000-2003
• Developed InGaAs/InP PIN photodiode epitaxial product.
• Developed InGaAs/InP and InAlAs/InP Avalanche Photodiode epitaxial products.
• Responsible for development of other Optoelectronic products such as HBTs, LEDs, lasers, waveguides, Ge photodetectors.
• Experience in many III-V material systems – AlGaAs, GaInP, InGaAs, InGaAsP, InAlAs, AlGaInP, GaAs, InP.
• Experience in analysis and usage of material and electrical characterization tools: ...
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