SUMMARY
• Inventor of two testing related patents, Automatic Test Detection of Unsoldered Thru-hole Connector Leads, US5637835 and System for Detection of Unsoldered Component, US5877033. Both of these inventions enable standard ATE test methods to detect various assembly defects which were previously undetectable.
• Innovator in creative cost savings for ATE test programs for over 20 years. Received an achievement award at Foxboro Company for developing ICT strategies to save money and reduce time to market on new designs.
• Designer of In-Circuit and Functional test solutions with significant focus on working with Design Engineering to implement testability (DFT) and manufacturability (DFM) in order to provide maximum testing capability with minimum costs.
• Leader providing technical guidance and supervision to test engineers, test technicians and manufacturing test personnel. Driving force of test program standardization and efficiency improvements.
PROFESSIONAL EXPERIENCE
TEST MANAGER/ENGINEER Sunburst EMS - West Bridgewater, MA September 2011 – April 2013
• Manage daily operations of contract manufacturing test department including allocation of resources and scheduling / training of test operators / technicians to achieve maximum manufacturing output.
• Technical resource for test operators and manufacturing repair technicians.
• Brought test department into conformance with ISO and Medical Regulatory agency requirements thru proper product documentation/record-keeping including test procedures, schematics, test program versions, evaluation of test fixtures & equipment accuracy and test data records.
• Achieved more than 75% reduction in test department product troubleshooting backlog.
• Tested and troubleshot customer products ranging from satellite RF communication control, Military navigational tracking products, ZigBee based 2.4Ghz low power wireless control, automotive CAN diagnostic tools, bionic prosthetics (iWalk robotic ankle) and variety of medical lab test instruments.
• Analyzed customer test equipment designs and proposed new or improved test plans as applicable.
• Utilized test engineering expertise to support and enhance ICT test programs, analyze test results from outside vendor Flying Probe and ICT testing of production assemblies.
SENIOR TEST ENGINEER Masoneilan (GE-Energy) - Avon, MA November 2008 – September 2011
• Maintained National Instruments Signal Conditioning hardware, Labview test programs and custom pneumatic test hardware for 13 test stations used in all levels of production assembly and functional test of Pneumatic Smart Valve Positioning units. Used HART protocol in a 4-20ma current loop.
• Implemented new tests, analyzed and revised existing tests using Design of Experiments/Gauge R&R methods in undocumented LabView 7 test programs including test and calibration adjustment of Current to Pressure (I/P) converters in Thermotron environmental chambers (-40°C to +80°C).
• Used National Instruments hardware & LabView test software to control and measure electronic, environmental and pneumatic parameters during production assembly and final testing.
• Brought existing test programs into conformance with ISO and multiple Safety Regulatory agency requirements thru proper implementation of RD&E released test methods and specifications.
• Improved product quality and reduced scrap by working with RD&E, Customer Quality and the Contract Manufacturer by identifying incorrect test limits and methods. The $15,000/month control module scrap rate saw a 50% reduction as a result.
• Provided In-Circuit test design inputs for new project introduction to a Contract Manufacturer in China.
Michael L. Matern
SENIOR TEST ENGINEER Waters Corporation - Milford, MA July 2000 – September 2008
• Developed all GenRad 228X In-Circuit test equipment, test software and test strategies in order to provide the highest customer quality at the lowest cost for over 20 analog/digital assemblies.
• Provided Design for Testability and Manufacturability (DFM/DFT) inputs to Design and Sustaining Engineering groups to insure implementation of new designs would meet those requirements.
• Represented all Test Engineering interests during hardware and software design reviews, provided test strategy plans including implementation time/cost estimates to project design meetings.
• Built working relationships with managers & engineers across a broad spectrum of RD&E, Sustaining Engineering, New Product Introduction, Purchasing & Production disciplines. As evidenced by many informal feasibility discussions which sought ideas and inputs regarding testing.
• Planned and coordinated the transfer of ATE equipment for multiple product lines to multiple Global subsidiaries and Contract Manufacturers.
• Designed test strategies for new products encompassing both In-Circuit and Functional levels, including decisions to provide enhanced In-Circuit tests while eliminating the need for Functional tests.
• Supported contract manufacturers in Asia and Europe with implementation, quality monitoring, manufacturing issues and program enhancements of both in-circuit and functional tests.
• Devised alternate implementations of engineering changes with ECAD group to reduce the impact on hardware and software for in-circuit and functional test projects. Significantly reduced NRE costs and faster production implementation of the changes was accomplished.
• Produced multiple functional board level test programs and fixtures for the Racal Freedom Series test system using LabView, Test Stand and custom designed test hardware.
• Eliminated levels of functional test with In-Circuit test enhancements using bi-level fixturing technology,
multiple projects of this type provided significant cost savings and reduced production cycle times.
• Responsible for GenRad 228X In-Circuit Test program and fixture development including in-house projects and outside vendor services.
• Responsible for calibration, maintenance and repair of In-Circuit test system and fixtures.
SENIOR TEST ENGINEER Foxboro Company (Invensys) - Foxboro, MA April 1988 – July 2000
• Developed Universal Test Fixturing for use with PCMCIA and other double-sided SMT circuit designs
with limited test access thus significantly reducing NRE costs, ability to implement similar new designs
and revisions with minimal cost and faster time...
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